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ST2263 doble  testing digital four-prble tester
ST2263 doble testing digital four-prble tester
ST2263 doble testing digital four-prble tester
Category: ST2263 Double Electric Measuring Four Probe tester
AddDate: 2022/12/2 13:27:26
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 I. Structural features                                                      

ST2263 double electric measuring four probe tester

ST2263 panel of four probe resistivity tester with double electrical measurement method

Software interface of ST2263 double electric measuring four probe tester

Four probe probe for thin film material testing Four probe probe for silicon material testing

       Four probe probe for thin film material testing              Four probe probe for silicon material testing

 II Overview                                                                      

ST2263 double electrical measurement digital four probe tester is a multi-purpose comprehensive measuring instrument that uses the straight or square four probe double position measurement improved Vanderberg measurement method to test resistivity/square resistance. The design of the instrument conforms to the national standard for physical testing methods of monocrystalline silicon and the American A.S.T.M standard. The transformation of current probe and voltage probe is used to conduct two electrical measurements, and the data is analyzed by double electrical measurements. The influence of sample geometry, boundary effect, probe inequality and mechanical excursion on the measurement results is automatically eliminated. Compared with the single electrical measuring straight line or square four probe, it greatly improves the accuracy, especially suitable for oblique four probe testing for micro areas.

The instrument consists of a host, an optional four probe probe, a test bench and PC software.

The host is mainly composed of a precision constant current source, a high-resolution ADC, an embedded microcontroller system, and a USB communication interface. All parameter settings and function conversion of the instrument host are input by digital keyboard and digital switch; It has zero position and full degree self calibration functions; The test function can be in automatic/manual mode; The instrument operation can be completed on the PC by the supporting software, or it can be completed independently on the four probe instrument panel by the detachable PC. The test result data is directly displayed by the host digital tube, or can be synchronously displayed, analyzed, saved and printed by the software interface!

Probe selection: according to the requirements of different material characteristics, there are many types of probes available. It has a high wear-resistant tungsten carbide probe probe to test the resistivity/square resistance of hard materials such as silicon semiconductors, metals and conductive plastics; There is also a spherical gold-plated copper alloy probe probe, which can measure the resistivity/square resistance of semiconductor materials such as conductive films of flexible materials, metal coatings or films, conductive films (ITO films) or nano coatings on substrates such as ceramics or glass. With the four terminal test fixture, the resistance of the resistor body, the low and median resistance of the metal conductor and the contact resistance of the switch can also be measured.

Selection of test bench: generally, four probe method is used to test resistivity. SZT-A or SZT-B or SZT-C or SZT-F type test benches are used.

The instrument is characterized by high measurement accuracy, high sensitivity, good stability, high intelligence, simple measurement, compact structure and convenient use.

The instrument is suitable for semiconductor material factories, device factories, scientific research institutions, and universities to test the conductivity of conductors, semiconductors, and semiconductor like materials, especially for the testing of micro areas with oblique four probes.

 III. Basic Technical Parameters                                     

3.1 Measuring range

Resistivity: 1 × 10-4~2 × 105 Ω - cm, resolution: 1 × 10-5~1 × 102 Ω-cm

Square resistance: 5 × 10-4~2 × 105 Ω/□, resolution: 5 × 10-5~1 × 102 Ω/□

Resistance: 1 × 10-5~2 × 105 Ω, resolution: 1 × 10-6~1 × 102 Ω

3.2 Material size (determined by the optional test bench and test method)

Diameter: Φ 15~180mm, unlimited handheld mode; or 180mm × 180mm, unlimited handheld mode

Length (height): direct test mode of test bench H ≤ 100mm, handheld mode is not limited

Measuring orientation: both axial and radial

3.3 4-1/2-digit digital voltmeter:

(1) Range: 20.00mV ~ 2000mV

(2) Error: ± 0.1% Reading ± 2 words

3.4 CNC constant current source

(1) Range: 0.1 μ A,1 μ A,10 μ A,100µA,1mA,10mA,100mA,1A

(2) Error: ± 0.1% Reading ± 2 words

3.5 Four probe probe (select one or add all)

(1) Tungsten Carbide Probe: Φ 0.5mm, linear probe spacing 1.0mm, probe pressure: 0 ~ 2kg adjustable

(2) Thin film square resistance probe: Φ 0.7mm, linear or square probe spacing 2.0mm, probe pressure: 0 ~ 0.6kg adjustable

3.6 Power supply

Input: AC 220V(110V) ± 10%, 50Hz(60Hz) Power consumption:<20W

3.7 Overall dimensions:

Host 220mm (long) × 245 mm wide × 100mm high

 IV. Contact Information                                                   

Sales Manager: Grace Zheng



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